![]() ![]() You can hide some software bins by clicking icons in the legend. Other entries in Wafer Selection represents the wafer maps in the file, color of each die is determined by its software bin. There is a stacked wafer map at the top of Wafer Selection that summarizes the total count of fail dut in each (X, Y) coordinates of all wafermaps in the current file. If STDF files contain wafer information (WCR, WIR, WRR records), the Wafer Map tab will be enabled. Test Statistic table displays the dut counts, bin name, bin number and precentage, bins with DUT counts of 0 will be hidden. ![]() you can hover over the rectangle to display its data range and dut counts.ĭisplay histograms of dut counts of each hardware bin and software bin in selected heads and sites. high/low limits in PTRs are changing over duts, the dynamic limits will be shown instead.ĭisplay interactive histograms of test item(s), y axis is the test value distribution. You can hover over the point to show more information. Each row is a DUT that's been tested in the selected heads and sites, data of selected tests will be appended to the rightmost column.ĭisplay interactive trend charts of test item(s), y axis is the value of the test item, x axis is the index of DUTs that's been tested in selected head and site. Select test item(s) and then navigate to Detailed Info -> Test Summary. Statistic (Cpk, mean, std dev, etc.) of the test items in the selected heads and sites is displayed in Test Statistics. The search box below can help you find test item(s) more easily. Importance Notice: Functional Tests (FTR) have no test value, instead, the test flag is used as the test value for drawing trend charts and histogramsĪll test items in the STDF file will be shown in the Test Selection, in which you can select single or multiple test item(s). Note: Data of Bn & Dn type is shown in HEX string. Same as DUT Summary table, use Fetch All Rows to load all data into the table. The precise location of GDR & DTR is hard to trace, the relative location compared to PIR/PRR is given instead.įor GDR, each line in the Value column represents a V1 data, which is displayed in the format of. For instance, the screenshot below showing the result of sorting the DUTs by Part ID.Īll the GDR (Generic Data Record) and DTR (Datalog Text Record) will be listed in Detailed Info -> GDR & DTR Summary. If STDF files contain multiple heads and/or sites, you may also filter out the DUTs of non-interest by selecting specific heads and/or sites in Site/Head Selection.ĭUTs' info can be sorted by any columns. A normal stdf file will contains several K DUTs, in order to improve performance, DUT Summary will not load all DUTs to the table, but if you want to load all, right click on the table and select Fetch All Rows. (Introduced in V4.0.0) Superseded DUTs will be marked in grey. Each line in the table represents a single DUT, and it will be marked in red if this DUT is failed. (Introduced in V4.0.0) Open the merge panel by clicking Merge button on the toolbar, user can add multiple files in merge groups,įiles in a same group will be merged into a single file and index 0 is regarded as the first file in a group.Īdding multiple merge groups is also supported, in case you'd like to compare merge groups.īy clicking the Fail Marker button on the toolbar can paint all failed test items in red, if the Find Low Cpk is enabled in Settings, test items with Cpk lower than the threshold (can be set in Settings) will be painted in orange.ĭUTs' info can be viewed in Detailed Info -> DUT Summary. ZIP file is created using DEFLATE compression method, which is the default on popular OSs' native zip tool.Note: ZIP format support is limited, works only if: If multiple STDF files are selected, compare mode is automatically enabled, you will see multiple sections in a single plot ![]()
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |